On the Estimation of Reliability Measures under Length Biased Sampling

Document Type

Presentation

Presentation Date

8-5-2001

Abstract or Description

The usual estimators of cell kinetic parameters resulting from labeled mitosis experiments are biased due to the fact that cells with longer DNA synthesis periods have greater probability of being labeled. In this note, estimators of reliability measures under random censoring are obtained and investigated. The Bayesian exponential reliability estimate under length biased sampling using a conjugate prior is presented.

Sponsorship/Conference/Institution

Joint Statistical Meetings (JSM)

Location

Atlanta, GA

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